Purdue scientists identify two genes in soybean that could prevent $250 million in lost yield

Purdue University researchers have identified two genes within the soybean genome that are highly resistant to a soilborne pathogen that causes Phytophthora root and stem rot, a disease that costs U.S. soybean growers more than $250 million annually in lost yield.

The discovery, made by a team of scientists led by Jianxin Ma and Teresa Hughes, could lead to the development of soybean cultivars better able to withstand the pathogen Phytophthora sojae.

The Purdue research was published online by Theoretical and Applied Genetics and is to appear in the journal’s November print edition.

Read the full story here: Disease resistance breakthrough could improve soybean profits

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